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Wed 16 September, 10:00

From Images to Traits: Machine Learning and Modelling for Plant Trait Estimation to Improve Wheat Breeding

Name: From Images to Traits: Machine Learning and Modelling for Plant Trait Estimation to Improve Wheat Breeding
Start: 2026-09-16T08:00:00.000Z
End: 2026-09-16T09:20:00.000Z
Location: ETH Zentrum

ETH Zentrum

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ETH Zentrum, Rämistrasse 101, 8092 Zürich
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